CAPTION(S): NEW TECHNOLOGY Prof Peter Cumpson with Newcastle University nanoLab's new X-ray Photoelectron Spectroscopy (XPS)
What does XPS stand for?
XPS stands for X-Ray Photoelectron Spectroscopy
This definition appears very frequently and is found in the following Acronym Finder categories:
- Science, medicine, engineering, etc.
See other definitions of XPS
We have 14 other meanings of XPS in our Acronym Attic
- Xml Permission-to Role Mapping
- Expandable Polystyrene
- Express Parcel Service (shipping)
- Extended Parallel Server
- Extended Physical Synthesis (Synospsys IC Compiler)
- Extreme Performance Systems (Dell)
- Extruded Polystyrene (also seen as XEPS)
- Hybrid Positioning System (Skyhook Wireless)
- Polystyrene Crystal
- X-Band Phase Shifter
- X-Ray Photoemission Spectroscopy
- Xeroderma Pigmentosum Society
- Xinghua Primary School (Singapore)
- Xingnan Primary School (Singapore)
- Xinmin Primary School (Singapore)
- Xishan Primary School (Singapore)
- XML Paper Specification (Microsoft Windows Vista)
- XML Portal Server (Sequoia Software)
- Xtreme Power Systems (Lake Havasu City, AZ)
- XUV Photometer System
Samples in periodicals archive:
Now, Professor Peter Cumpson and Dr Naoko Sano have used cutting-edge X-ray Photoelectron Spectroscopy (XPS) to analyse surfaces similar to the standard kilogram to assess the build-up of hydrocarbons - and how to remove them.
2, pp 42-55, February 2011), x-ray photoelectron spectroscopy was described.
The morphology, dimensions and properties of the synthesized nanoparticles have been measured via characterization methods such as SEM, XRD, X-ray photoelectron spectroscopy (XPS), IR spectroscopy, thermal and electrochemical analyses.
Scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), and energy-dispersive X-ray spectroscopy (EDX) were employed at Columbia University, from whom we obtained the samples, to inspect the sample morphology and cleanliness both before and after measurements (Fig.
Thermo Scientific debuted the K-Alpha x-ray photoelectron spectroscopy system (see page 7), positioning what was once a highly specialized technique for more mainstream applications in the materials characterization market.
From here we can decide if the use of surface sensitive techniques like infrared spectroscopy (IR), x-ray photoelectron spectroscopy (XPS) or secondary ion mass spectrometry (SIMS) is appropriate.