Among their topics are determining the structure of single crystals, analyzing residual stress by X-ray diffraction methods, texture analysis by advanced diffraction methods, the kinetics of phase transformations and of other time-dependent processes in solids analyzed by powder diffraction, and calibrating laboratory X-ray diffraction equipment using the US National Institute of Standards and Technology standard reference material.
What does XRD stand for?
XRD stands for X-Ray Diffraction
This definition appears very frequently
See other definitions of XRD
We have 5 other meanings of XRD in our Acronym Attic
- Xerox Research Centre of Canada
- Xtreme Rock Crawling Challenge (vehicles)
- Extended Resolution Compact Disc (JVC)
- X-Ray Crystal Density
- Xerox Research Centre Europe
- X-Ray Calibration Facility (NASA)
- X-Ray Clibration Facility (US NASA)
- X-Rated Critics Organization
- X-Ray Computed Tomography
- X-Ray Diffractometer
- X-Ray Diode
- XML (Extensible Markup Language) Resource Definition (programming language files)
- X-Ray Diffraction Analysis
- X-Ray Dynamic Defectoscopy
- X-Ray Diffraction Topography
- eXtreme Reactive Environment
- X-Responsive Element (genetics)
- Xenobiotic Responsive Element
- XUL Runtime Environment
Samples in periodicals archive:
Over the years, X-ray diffraction has been a powerful and reliable technique to obtain information about the microstructure, such as crystallinity, crystalline orientation, and crystalline interplanar spacing, in the films (5-7).
Engineering decisions require reliable quantitative data, and x-ray diffraction (XRD) residual stress measurement provides this data.
As well as their roles within the company, they have collectively published more than 400 scientific articles and co-authored a book entitled, `High Resolution X-ray Diffraction and Topography'.
On page 4, the author stated "Minerals, especially small-sized ones, commonly are identified using x-ray diffraction and spectrographic techniques.
Introduction Since long, x-ray diffraction line broadening is used for the investigation of dislocation distributions; due to the stress fields induced by the dislocations atoms are displaced from their ideal lattice positions, which causes diffraction line broadening.
5 million for X-ray diffraction technology enhancements and up to $2.