When combined, the techniques of Fourier transform infrared spectroscopy and secondary ion mass spectrometry can be used to determine the chemical form of the hydrogen in a substance, as well as its abundance and its isotopic composition.
What does SIMS stand for?
SIMS stands for Secondary Ion Mass Spectrometry
This definition appears very frequently and is found in the following Acronym Finder categories:
- Science, medicine, engineering, etc.
See other definitions of SIMS
We have 108 other meanings of SIMS in our Acronym Attic
- Safety in Mines Research Advisory Committee (South Africa)
- System Integration Module Reference Manual
- Singapore Integrated Multiple Reference Station Network
- Safety Information Management System
- Scandinavian Conference on Simulation and Modeling
- School Information Management System
- School of Industrial and Manufacturing Science (UK)
- School of Information Management and Systems
- Scripps Institutions for Medicine and Science
- Seattle Insight Meditation Society (Washington)
- Security Information Management Systems
- Selected Item Management System
- Service Information Management System
- Shared Information Management Services (Toronto, Ontario, Canada)
- Ship's Information Management System
- Shuttle Imaging Microwave System (US NASA)
- Shuttle Inventory Management System
- Single Interface to Multiple Sources
- Single Item, Multi Source
- Site Improvement through Monitoring Systems (healthcare)
Samples in periodicals archive:
Secondary ion mass spectrometry (SIMS) appeared to show arsenic associated with its DNA.
The white paper provides an insight and summary into how a range of analytical protocols using Secondary Ion Mass Spectrometry (SIMS) and other surface analysis techniques are providing professionals in the semiconductor and related industries with solutions to challenges that arise during product development, process improvement, reverse engineering and failure analysis.
The topics include time-of-flight secondary ion mass spectrometry, synchrotron-based techniques, in-depth analysis and profiling, characterizing nanostructured materials, problem-solving methods in metallurgy with surface analysis, composites, the surface analysis of biomaterials, and electron spectroscopy in corrosion science.
Secondary ion mass spectrometry (SIMS) is an important surface science technique that provides very high sensitivity for the detection of trace elements in solid samples, while also providing good spatial detail.
From here we can decide if the use of surface sensitive techniques like infrared spectroscopy (IR), x-ray photoelectron spectroscopy (XPS) or secondary ion mass spectrometry (SIMS) is appropriate.
They will also be presented at the following two occasions: the 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) to be held in Manchester, UK, from September 12 to 16, and Cosmetics 2005 International Conference-World Wide Wellness to be held in Florence, Italy from September 19 to 21.