After a historical overview, coverage in 38 chapters encompasses magnetic metallic multilayers, magnetic tunnel junctions, semiconductors, the nanoscale, and applications.
What does MTJ stand for?
MTJ stands for Magnetic Tunnel Junction
This definition appears very frequently and is found in the following Acronym Finder categories:
- Science, medicine, engineering, etc.
See other definitions of MTJ
We have 13 other meanings of MTJ in our Acronym Attic
- Maximum Tolerated Infusion Time (cancer treatment)
- Ministry of Telecommunications and Information Technology (Palestine)
- MTech (Master of Technology) Information Technology (Andhra University; India)
- Multi-Token Inter-Arrival Time
- Making the Invisible Visible (book)
- Mag Tape Input Window
- Military Transitional Issues Working Group
- MetroTix, Inc. (Saint Louis, MO, USA)
- Moving Target Indicator Exploitation
- Moving Target Information Exploitation
- Maximum Tolerable Jitter
- Missourians for Tax Justice
- Mobile Tools for Java (Eclipse DSDP Project)
- Montrose, CO, USA - Montrose County Airport (Airport Code)
- Multi-Tone Jamming
- Myotendinous Junction
- Malaysia-Thailand Joint Authority
- Maine Township Jewish Congregation (Des Plaines, IL)
- Middle Tennessee Java Users Group (software usage promotion)
- McHenry Township Junior Warriors (Illinois)
Samples in periodicals archive:
A thin non-magnetic organic semiconductor layer and an epitaxial ferromagnetic oxide film were employed to form a hybrid magnetic tunnel junction.
NEC's MFF operations were produced by integrating data flip flop (DFF) with magnetic tunnel junctions (MTJ), in addition to circuits that switch the direction of MTJ's magnetization.
IBM Research developed a miniature component called the magnetic tunnel junction in 1974, but did not adapt it as a means to store information and build an actual working MRAM chip until 1998.
Topics covered include: a case study and analysis of magnetic current imaging with magnetic tunnel junction sensors, logical-to-physical device navigation using place-and-rouse data as an alternative to LVS, intermittent failures in high pin count packaging, advanced fringe analysis techniques in circuit edit, and failure analysis navigation system connecting hardware analysis to software diagnosis.