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Samples in periodicals archive:
The FOX-15 system is designed for use with wafers that require test and burn-in times typically measured in hours," said Steve Steps, senior director of wafer level burn-in and test at Aehr Test Systems.
We look forward to being a part of the technology base that will successfully bring the industry's first wafer level burn-in and test process to high volume production.
In a further expansion of its known good die (KGD) and flip chip manufacturing capabilities, Motorola's (NYSE: MOT) Semiconductor Products Sector (SPS) developed and qualified the industry's first Wafer Level Burn-in and Test (WLBT) process for high performance, flip chip microprocessors.