What does TDBI stand for?

Test During Burn-In

This definition appears very rarely and is found in the following Acronym Finder categories:

Information technology (IT) and computers
Business, finance, etc.

Other Resources:

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Samples in periodicals archive:

The customer's primary need is the flexibility to provide 32M vectors on all 320 I/Os in the system plus the ability to capture per pin device failures while doing test during burn-in.

AEHR TEST SYSTEMS GETS ORDER FOR ABTS TEST SYSTEM

The ABTS is Aehr Test's newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices.

Aehr Test Systems Schedules Second Quarter Fiscal Year 2009 Earnings ...

The ABTS is Aehr Test's newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices.

Aehr Test Systems Schedules First Quarter Fiscal Year 2009 Earnings ...