Covering electron diffraction, photoemission, and alternative techniques, they look at reflection high-energy electron diffraction, inelastic scattering, ultraviolet photoemission spectroscopy, X-ray photoelectron spectroscopy, in situ spectroscopic ellipsometry, ion-beam surface characterization of thin multicomponent films, spectroscopies combined with reflection high-energy electron diffraction, deposition vapor monitoring, and real-time studies of epitaxial film growth using surface X-ray diffraction.
What does SE stand for?
SE stands for Spectroscopic Ellipsometry
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We have 106 other meanings of SE in our Acronym Attic
- Space Elevator
- Space Empires (gaming)
- Spaceship Earth (EPCOT)
- Special Edition
- Special Education
- Special Effects
- Special Envoy
- Special Equipment
- Specialized Experience
- Spectral Efficiency
Samples in periodicals archive:
2) Ultra high-speed measurements This product can achieve ultra-high-speed measurements (maximum speed of 20ms/point) with the snapshot measurement by using spectroscopic ellipsometry with two high-order retarders which was impossible for the previous spectroscopic ellipsometer.
Using the extremely bright X-rays generated by the Diamond synchrotron and combining this with the spectroscopic ellipsometry at the University of Sheffield, the team has been able to unravel new information.
UV irradiated polymers were characterized with in situ and ex situ spectroscopic ellipsometry (SE).
Key Topics Covered: PART 1: INTRODUCTION 1 Introduction to Strain Metrology for Semiconductors 2 Strain, Stress and Semiconductor Properties PART 2: OPTICAL STRAIN METROLOGY 3 Variable Angle Spectroscopic Ellipsometry 4 Photoreflectance Method 5 Micro-Raman Spectroscopy PART 3: ELECTRON BEAM STRAIN METROLOGY 6 Cathodoluminescence Method 7 Nano-Beam Diffraction and Convergent Beam Electron Diffraction 8 Dark-Field Electron Holographic Moire Method PART 4: EMERGING STRAIN METROLOGY 9 Tip-Enhanced Raman Spectroscopy 10 Atomic Force Microscopy Digital Image Correlation Method 11 Synchrotron X-Ray Micro/Nanodiffraction Methods 12 Conclusion and Outlook For more information visit http://www.
2) Ultrahigh-speed measurements This product can achieve ultra-high-speed measurements (maximum speed of 20ms/point) with the snapshot measurement by using spectroscopic ellipsometry with two high-order retarders which was impossible for the previous spectroscopic ellipsometer.
The only high-performance spectroscopic ellipsometry (SE)-based CD metrology tool with sub-two-second move-acquire-measure (MAM) time, SpectraCD-XT provides a two-fold increase in throughput (to more than 100 wph) compared to KLA-Tencor's previous-generation platform at comparable performance.
NIST researchers have recently derived a unique Generalized Tauz-Lorentz (GTL) dispersion model that can successfully model spectroscopic ellipsometry data for high-k thin films in the spectral range of 1.