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of Piraeus, Greece; TIMA laboratory, France; and Intel) present the articles under the following themes: online error detection and correction, self-checking circuits and error detecting codes, radiation hardening techniques, soft error detection and correction methodologies, control-flow checking and fault-tolerance in special applications, fault injection, benchmarking and standardization in software-based SER characterization, mitigation techniques for transient errors, memory self-test and self-repair, posters, reliability and circuit stimulation, networks-on-chip and labs-on-chip, parametric testing techniques, radiation-induced SER, self-test generation techniques, and laser-based fault injection in memories.