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At the terminus to liquid (liquid microjet, Micro fluid film) and solid samples (single crystals and thin film samples) with synchrotron radiation Resonant inelastic X-ray scattering (RIXS) , X-ray photoelectron spectroscopy (XPS or ARPES) and UV-VIS spectroscopy is investigated in the energy range from 200 eV to about 1 100 eV.
Individual chapters are devoted to the main branches of inelastic X-ray scattering: nonresonant inelastic X-ray scattering with characteristic valence electron excitations, nonresonant inelastic X-ray scattering with core- electron excitation, X-ray Raman scattering, the Compton scattering regime, and resonant inelastic X-ray scattering (RIXS) spectroscopy.