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What does JTAG stand for?

Joint Test Action Group (developer of IEEE Standard 1149.1-1990)


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This definition appears very rarely and is found in the following Acronym Finder categories:

  • Information technology (IT) and computers
  • Organizations, NGOs, schools, universities, etc.

See other meanings of JTAG

Other Resources:

Link/Page Citation...

<< PreviousAbbreviation Database SurferNext >>
Joint Technical Advisory Detachment (US DoD; Vietnam era unit)
Joint Test Assets Directory
Journal of Teaching in the Addictions (International Coalition for Addiction Studies Education)
Joint Technical Architecture Development Group
Joint TADIL A Distribution System
Journal of Theoretical and Applied Electronic Commerce Research
Japan Town Anime Faire
Joint Technical Activities Group
Joint Technical Advisory Group
Joint Technical Assessment Group
Joint Test Advisory Group (US DoD)
Joint Turbine Advanced Gas Generator
Joint Turbine Advanced Gas Generator - Medium
Joint Tactical Air-to-Ground Station
Joint Tactical Ground Station
Joint Theater Air-Ground Simulator System (US DoD)
John Tagle Associates Inc. (Troy, MI)
Just Thinking About It
Japanese Teachers Association of Michigan
Journal of Taipei Astronomical Museum (Taipei, Taiwan)



Samples in periodicals archive:
1 Boundary-Scan Standard, which is commonly referred to as JTAG after the Joint Test Action Group which initiated development of the standard.
That's when an ad hoc working group, the Joint Test Action Group (hence the JTAG name for the methodology), began working on concepts for a circuit board test technology that would not require physical contact between a probe and a circuit board.
1 Boundary-Scan Standard, which is commonly referred to as JTAG after the Joint Test Action Group which initiated development of the standard.
Acronyms: ASIC: Application Specific IC ATPG: Automatic Test Pattern Generator BIST: Built In Self-Test DFD: Design for Debug/Diagnosis DFT: Design-for-Test IC: Integrated Circuits JTAG: Joint Test Action Group PC: Personal Computer PCB: Printed Circuit Board RTL: Register Transfer Level SOC: System-on-Chip TurboDebug is a trademark of SynTest Technologies, Inc.
Acronyms and definitions: ASIC: Application Specific Integrated Circuits BIST: Built-in Self-test DFT: Design-for-Test IP: Intellectual Property JTAG: Joint Test Action Group SoC: System-on-Chip Note to Editors: TurboBIST-LOGIC, TurboBIST-Memory, and TurboScan are trademarks of SynTest Technologies, Inc.
com, Attn: Charlie Miller Acronyms and definition ASIC Application Specific IC EDA: Electronic Design Automation HDL: Hardware Description Language HW/SW: Hardware/Software IC: Integrated circuit JTAG: Joint Test Action Group, IEEE Std 1149.
Called Static Component Interconnection Test Technology (SCITT), the concept is compatible with boundary-scan, the recognized standard for manufacturing defect testing, formulated by the international Joint Test Action Group (JTAG) and standardized as IEEE Std.
The debugging tools will range from simple, inexpensive, Joint Test Action Group (JTAG)-based debuggers, to full-featured pod-based in-circuit emulators equipped with real-time trace and complex events.

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