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00 Paperback TK7874 A September 2007 symposium gathered academics, research scientists, and industrial practitioners in the global defect and fault tolerance (DFT) community to examine traditional DFT topics, such as error correction and fault tolerant designs, as well as new topics, including DFT in networks-on-chips, nanotechnology, and soft errors.
Additionally, the IREM laser scanning microscope (LSM) option provides rapid and accurate global defect localization to complement IREM's fault localization capabilities.