What does FIB stand for?

STEM offers at least an order-of-magnitude better resolution than SEM, and recent developments in microscope technology and automated focused ion beam (FIB) based sample preparation have improved analytical speed to the point that STEM now compares favorably with SEM in throughput, turnaround time, and even cost-of-ownership.

The "Nano-Bible" was written using a device called Focused Ion Beam.

To investigate the interface between the GMB and the titania coating, focused ion beam (FIB) was used to prepare a section of the titania coated GMB to be analyzed by TEM.

These units include a high resolution, digital scanning, tunneling microscopy/atomic force microscope facility; a 200 KeV scanning transmission electron microscopy/transmission electron microscope; and dual beam focused ion beam units.

They produced a focused ion beam approximately one three-millionth of an inch thick, an apparent world record.

Microscope markets are segmented as optical microscopes, electron microscopes, scanning probe microscopes, and focused ion beam microscopy.

The university houses existing equipment that includes analytical transmission electron microscopes (models JEOL 2010F STEM and VG HB601 Cryo), conventional TEM (model Philips CM12), scanning electron microscopes (models Philips 515, JEOL 7000F, Focused Ion Beam and Zeiss NVision40) and scanning probe microscopy (models Digital Instruments Nanoscope III, Light Microscopes, Zeiss Axioplan, Nikon Confocal Microscope, and Leica metallographic light microscope with Clemex Digital Image Analysis System -- say that 10 times fast).

SSI NanoTechnology's Scientific Instruments business sells thermal analysis, scanning probe microscopy, XRF, ICP-OES, ICP-MS, focused ion beam, mask repair and radiation measurement systems.