We chose the competitively priced, high performance Anadigics family of amplifier products as they support the broadest range of UMTS/LTE frequency bands, offer scalable power levels within a single footprint, and enable rugged designs capable of withstanding electrical overstress conditions.
What does EOS stand for?
EOS stands for Electrical Overstress
This definition appears very frequently and is found in the following Acronym Finder categories:
- Science, medicine, engineering, etc.
See other definitions of EOS
We have 217 other meanings of EOS in our Acronym Attic
- École Ouvrière Supérieure (French; graduate school; Brussels, Belgium)
- Economic Operator System (EU)
- Economic Opportunity Studies, Inc. (Washington, DC)
- Économie, Organisations, Société (French: Economics, Organizations, Society)
- Economies of Scale
- Edge of Sanity (band)
- Educational Opportunity Service (ACT, Inc.)
- Egyptian Organization for Standardization and Quality Control
- Egyptian Orthodontic Society
Samples in periodicals archive:
The EOS/ESD Symposium is an annual international technical forum on electrical overstress and electrostatic discharge.
A view of work on electrical overstress (EOS) has also been included.
Under the program, TSMC will provide IP Alliance partners with Calibre PERC rule decks that perform reliability checks designed to address customers advanced circuit verification needs for electrostatic discharge (ESD), electrical overstress (EOS), signals crossing multiple power domains, advanced ERC, and other reliability concerns.
These same arguments also apply for Electrical Overstress (EOS) failures, which are independent of component-level ESD protection.
New LNBTVS range protects against lightning and electrical overstress surges
com) of Gistel has been selected by Analog Devices (ADI) to develop a library of on-chip electrostatic discharge and electrical overstress (ESD/EOS) clamps based on its PowerQubic([R]) technology for ADI devices with 60V interfaces.
Kang's research is in the area of modeling, simulation and design guidelines for VLSI circuit reliability, particularly to assure the immunity of a circuit's input/output (I/O) buffers to electrostatic discharge (ESD) and electrical overstress (EOS).