What does ERO stand for?

Edge Roll-Off (silicon wafer geometry)

This definition appears very rarely and is found in the following Acronym Finder categories:

Information technology (IT) and computers
Science, medicine, engineering, etc.

Other Resources:

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Samples in periodicals archive:

Business Highlights for the second quarter of fiscal 2008 * KLA-Tencor introduced the WaferSight 2TM, the semiconductor industry's first metrology system that enables wafer suppliers and chipmakers to measure bare wafer flatness, shape, edge roll-off and nanotopography in a single system with the high precision and tool matching required for 45nm and beyond.

KLA-Tencor Reports Fiscal 2008 Second Quarter Results

KLA-Tencor (NASDAQ:KLAC) today introduced the WaferSight 2, the semiconductor industry's first metrology system that enables wafer suppliers and chipmakers to measure bare wafer flatness, shape, edge roll-off and nanotopography in a single system with the high precision and tool matching required for 45nm and beyond.

KLA-Tencor Introduces Complete Measurement Solution for Critical 45nm ...

ADE will be demonstrating the WaferSight wafer flatness, shape and edge roll-off metrology system, as well as its full line of silicon wafer production and semiconductor process control systems, at Semicon West, July 11 -13, Moscone Center, South Hall, Booth 1302, in San Francisco.

ADE Receives Large Multi-Million Dollar Order From Major Japanese ...