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What does DUT stand for?

DUT stands for Device Under Test

This definition appears very rarely

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We have 14 other definitions for DUT in our Acronym Attic

Samples in periodicals archive:

In addition, the SSC modulation on the data from either the BERTScope S generator or from a device under test may be displayed and analyzed.
The PM300WLR is the first dedicated probe system for wafers up to 300mm that enables semiconductor manufacturers to quickly obtain critical results about the reliability of the device under test (DUT).
The test system hardware is based on NI PXI-4070 6 1/2-digit FlexDMMs for voltage and current measurements, NI PXI-6533 high-speed digital I/O modules to communicate to the device under test and write the calibration values to the onboard EEPROM, an NI PXI-6508 general-purpose digital I/O module and an NI PXI-1045 chassis.
5V, +/- 40mA ranges --Switches for pin driver super voltages and driven guard pin (E4287) --Test head ground sense --On-chip voltage clamps protect the device under test (DUT) from stress/damage --Stable for up to 300pF capacitive loads with no external compensation capacitors --Digitally selectable compensation enable use with capacitive loads to 10nF Pricing and Availability The E42x7 family is available immediately in production quantities.