Additional testing performed on all orders of this series includes the following: * Surge current 10 cycles -55/+85C * Visual examination 124 piece sample * Dimensional 124 piece sample * Solderability 12 piece sample * Resistance to solvent 12 piece sample Glossary COTS Commercial Off-the-Shelf CV Capacitance-Voltage DSCC Defense Supply Center, Columbus ESR Equivalent Series Resistance About KEMET KEMET's common stock is listed on the NYSE under the symbol "KEM.
What does CV stand for?
CV stands for Capacitance-Voltage (measurements)
This definition appears frequently and is found in the following Acronym Finder categories:
- Science, medicine, engineering, etc.
See other definitions of CV
We have 42 other meanings of CV in our Acronym Attic
- Chinese Union of Zurich (est. 2003)
- Community Use Zone (Crocker Range Park Management Plan; Malaysia)
- Cuzco, Peru - Tte Velazco Astete (Airport Code)
- Copper-Zinc Superoxide Dismutase (enzyme)
- Caballo Vapor (Spanish)
- Cablevisión (Argentina)
- Cache Verification
- Calorific Value
- Campus Village
- Capcom Vancouver (video games; Capcom Co. Ltd.; Japan)
- Cape Verde (Country)
- Capital Variable (Spanish business entity)
- Cargo Van
- Cargo Variant
- Carrier Variant (aircraft with modifications to permit operations to/from aircraft carriers)
- Carrier Volplane (Fixed Wing)
- Carrier, General Purpose (US Navy)
- Cartell-Verband (Burschenschaft mit Katholisch-konservativen werten)
Samples in periodicals archive:
The capacitance-voltage measurements were measured using a 3532 HIOKI HITESTER LCR.
2 upgrade: an expanded frequency range for the system's Capacitance-Voltage (C-V) measurement capability and support for the company's new nine-slot Model 4200-SCS instrument chassis.
A variety of important device parameters can be extracted from current-voltage (I-V) and capacitance-voltage (C-V) measurements, including output current, conversion efficiency, maximum power output, doping density, resistivity, etc.
a leader in semiconductor device characterization and parametric test, offers customers around the world a variety of flexible solutions for current-voltage (IV), capacitance-voltage (C-V), and pulsed I-V measurements and analysis.
In addition to IV measurements, what well may be the first capacitance-voltage (CV) measurements of molecular monolayer-based devices were taken at NIST.
a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing" on Thursday, April 26, 2012.
A NIST scientist, in collaboration with researchers at International SEMATECH, recently completed a study of the proper use of capacitance-voltage measurements to extract interface state density of high dielectric-constant (alternate) gate dielectrics for metal-oxide-semiconductor (MOS) devices.