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This includes forward-looking views of possible changes in the standard device level tests (HBM and CDM), as well as the expected progress in other important areas, such as transmission line pulsing (TLP), transient latch-up (TLU), cable discharge events (CDE), and charged board events (CBE).
The devices help protect against damage caused by electrostatic discharge (ESD), surge and cable discharge events.
ESD, EOS, EMI, EMC, and latchup semiconductor component and system level testing to demonstrate product resilience from human body model (HBM), transmission line pulse (TLP), charged device model (CDM), human metal model (HMM), cable discharge events (CDE), to system level IEC 61000-4-2 tests
With the electronics industry demanding better protection at the system level, the TClamp2502N also protects telecom and networking interfaces against the ubiquitous threats from electrostatic discharge (ESD), cable discharge events (CDE) and electrical fast transients (EFT).
Aggressive ESD protection is essential on DisplayPort systems because of the increased human interaction with the interfaces that increases the risk of electrostatic discharge (ESD), cable discharge event (CDE) or latchup.
Additionally, the AS1602 provides an unprecedented level of ESD protection by enabling the system to exceed +/- 25kV air discharge (IEC 61000-4-2 specifications) and +/-12kV cable discharge event (CDE).
The low clamping voltage of the RClamp2504P provides IEC 61000-4-x compliant electrostatic discharge (ESD), cable discharge events (CDE) and electrical fast transient (EFT) protection for downstream ICs.
Aggressive ESD protection is essential on HDMI systems because the increased usage of video cameras, game consoles, DVD players and other appliances increases the risk of a cable discharge event (CDE), which is a type of ESD.