What does AFM stand for?

Atomic Force Microscopy

This definition appears very rarely and is found in the following Acronym Finder categories:

Science, medicine, engineering, etc.

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Association Figurines et Maquettes de Montrouge (French: Montrouge Miniature Figurines Association; Montrouge, France) Association Française contre les Myopathies Association Française de Mécanique (French: French Association of Mechanics) Association Française de Musicothérapie (French: French Music Therapy Association) Association Française du Marketing (French: French Marketing Association) Association of Facilities Managers Association of Futures Market Athletic Field Maintenance Atmospheric Flight Mechanics (American Institute of Aeronautics and Astronautics) Atomic Force Microscope		Audio Frequency Modulation Automated Formal Methods (Workshop) Automatic Firing Mechanism Automatic Flight Management Autoriteit Financiële Markten (Dutch: Authority for the Financial Markets) Aviation Fleet Maintenance Aviation Forecast Model Award Fee Milestone Award Fee Monitor Axial-Field Machine

Samples in periodicals archive:

Atomic force microscopy employs a cantilever so small that its tip tapers to a nanoscale point which provides scientists with an advanced imaging method in nanoscale points.

Iran Produces Atomic Force Microscope

lt;p>In the experiment, IBM scientists were able to map the chemical structure of a pentacene molecule using atomic force microscopy (AFM).

IBM zooms into molecule for power-efficient chip research

The atomic force microscopy surprised us by demonstrating that small changes in these interactions could have a large impact on the break up of the stream, conclusively showing that these interactions were actually controlling the droplet formation," he added.

Sand can behave like water

The results of atomic force microscopy (AFM), scanning electron microscopy (SEM), and auger electron spectroscopy (AES) analyses reveal that the [Al.

[Al.sub.2][O.sub.3] films with Ni-based buffer layer prepared by ...

ATOMIC FORCE MICROSCOPY CHARACTERIZING THE PORE STRUCTURES OF PAPER COATINGS WITH SCANNING PROBE MICROSCOPY By Sabina Di Risio and Ning Yan APPLICATION: Atomic force microscopy can characterize the z-directional pore structure of paper coatings at a high resolution.

TAPPI Journal summaries

Scanning electron and atomic force microscopy was used for the first time to view the maturation of the severe acute respiratory syndrome-associated coronavirus at the cell surface.

Topographic changes in SARS coronavirus--infected cells during late ...

Atomic force microscopy (AFM) is taking emulsifier research to the molecular level.

Emulsifiers: Going to the next level

Current measurement methods such as scanning electron microscopy, atomic force microscopy, and optical scatterometry, face significant challenges in the characterization of dense, high aspect ratio, nanoscale features because, in general, smaller structures are increasingly difficult to measure.

NIST develops high-resolution technique for characterization of ...